Dr. Archita Sengupta is a Principal Engineer, working at Intel for 20+ years. She is currently leading specific advanced metrology & defectivity control program from global supply chain and spearheading technical collaboration with multi-organizations for development and implementation of advanced chemical analytical metrology for defect detection and characterization. She has a PhD in Physical Chemistry/Chemical Physics.
Spanning about 25 years in SEMI career, Archita is playing a critical role as advisor and pro-active mentor for many internal and external industry-consortia-university collaborative platforms. For the past decade, Archita has been the active voice and champion of the “Collaborative Global Supplier Eco-system End to End Defectivity Understanding and Control” campaign for Next Generation SEMI processes, & with this regard working with Industry partners, co-driving directives of future standards, spec and analytics technology development.
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Our Mission
Facilities are the lifeblood of the semiconductor fab. Underpinning critical roles in yield enhancement, environmental sustainability, and industry growth, they are undergoing transformative change.
Yet despite this key role, there has never been a collaborative forum dedicated to the extremely complex and technically challenging nature of facilities – until now.